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COM 2014 - 53rd Annual Conference of Metallurgists
 
Nanoscale Materials Characterization

This symposium highlights a large range of nanoscale characterization techniques including microscopy, spectroscopy/spectrometry, scattering, nanomechanical and other tools, as well as with specimen preparation methods and handling. The research presented will promote the education and dissemination of new characterization techniques into the academic and industrial research communities.

Organizers:

COM 2014 Program

 


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